Enhanced charge trapping in bimodal brush functionalized silica-epoxy nanocomposite dielectrics

Timothy Michael Krentz, Yanhui Huang, J. Keith Nelson, Linda S. Schadler, Michael Bell, Brian Benicewicz, Su Zhao, Henrik Hillborg

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    10 Scopus citations

    Abstract

    This manuscript details the processing, and investigates the dielectric properties, of surface ligand engineered epoxy nanocomposites. They display significant improvements in dielectric breakdown strength (DBS). Thermally stimulated depolarization current (TSDC) measurements and pulsed electroacoustic analysis (PEA) results are used to investigate space charge evolution and trapping. These techniques reveal the potential underlying phenomena behind the DBS enhancement.

    Original languageEnglish (US)
    Title of host publication2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages643-646
    Number of pages4
    ISBN (Electronic)9781479975235
    DOIs
    StatePublished - Dec 22 2014
    Event2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014 - Des Moines, United States
    Duration: Oct 19 2014Oct 22 2014

    Publication series

    Name2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014

    Other

    Other2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014
    Country/TerritoryUnited States
    CityDes Moines
    Period10/19/1410/22/14

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

    Fingerprint

    Dive into the research topics of 'Enhanced charge trapping in bimodal brush functionalized silica-epoxy nanocomposite dielectrics'. Together they form a unique fingerprint.

    Cite this