| Original language | English (US) |
|---|---|
| Pages | 32b-32b |
| DOIs | |
| State | Published - 2005 |
Parallelizing a Defect Detection and Categorization Application
L. Glimcher, G. Agrawal, S. Mehta, Ruoming Jin, R. Machiraju
Research output: Contribution to conference › Paper › peer-review
4
Scopus
citations