Fault Tolerant Frequent Pattern Mining
- Sameh Shohdy,
- Abhinav Vishnu,
- Gagan Agrawal
Scholary Output:
Contribution to conference
Paper
Peer-reviewRelated Event
Title
2016 IEEE 23rd International Conference on High Performance Computing (HiPC)
Event type
ConferenceDate
12/19/2016 - 12/22/2016Location
Hyderabad, India
Publication Information
Output type
Scholary Output:
Contribution to conference
Paper
Peer-reviewOriginal language
English (US)Pages from-to (Number of pages)
Pages 12-21Publication milestones
- Published - 12/2016
Publication status
Published - 12/2016
Publication IDs
- Scopus: 85015254325
Access to documents
Publication metrics
Metrics
Fractional count
1
Fractional count
0.33
Fractional count
2
Fractional count
0.67
Fractional count
1
Fractional count
1
SciVal
FWCI
0.22
SciVal
Author count
3
SciVal
Paper percentile
36
SciVal
citations
1
PlumX, opens in new tab
Captures
1
Citation count
1