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In situ optical microspectroscopy of the growth and oxidation of silver nanoparticles in silica thin films on soda-lime glass

  • J. A. Jiménez
    ,
  • M. Sendova
    ,
  • T. Hartsfield
    ,
  • M. Sendova-Vassileva
  • New College of Florida
    ,
  • Bulgarian Academy of Sciences
Scholary Output:
Contribution to journal
Article
Peer-review

Abstract

An in situ optical microspectroscopy investigation of the growth and oxidation of silver nanoparticles (NPs) embedded in SiO2 thin films deposited on soda-lime glass has been conducted in real time during thermal processing in air. Variation of Ag NP size is followed by fitting of surface plasmon resonance (SPR) with spectra calculated by Mie theory, and analysed concurrently with the time evolution of SPR peak intensity. The NP transformations appeared to be temperature and time dependent. Silver NPs were indicated to grow at relatively high temperatures (e.g. 600 °C) due to Ostwald ripening, followed by a plateau and a gradual decrease in size resulting in SPR vanishing due to oxidation. The three phases were well separated in time. Oxidation appeared dominant at lower temperatures (e.g. 400 °C) as indicated by a continuous decrease in Ag particle size. The product of Ag NP oxidation was revealed by photoluminescence spectroscopy as single Ag + ions. Furthermore, the data indicated that: (i) Ag+ ions are formed during heat treatment under an Ag/Ag+ redox equilibrium; (ii) the ions diffuse from the SiO2 matrix towards the soda-lime substrate where they stabilize; and (iii) the continuous removal of these ions from the matrix is necessary in order for the equilibrium to be displaced towards oxidation.

Publication Information

Output type

Scholary Output:
Contribution to journal
Article
Peer-review

Original language

English (US)

Pages from-to (Number of pages)

Pages 158-165 (8 pages)

Journal (Volume, Issue Number)

Materials Research Bulletin (Volume 46, Issue 2)

Publication milestones

  • Published - 02/01/2011

Publication status

Published - 02/01/2011

ISSN

0025-5408

Publication IDs

  • Scopus: 78651292619

Publication metrics

Metrics

SciVal
FWCI
1.73
SciVal
Author count
4
SciVal
citations
19
SciVal
Paper percentile
76
Fractional count
1
Fractional count
0.25
Fractional count
3
Fractional count
0.75
Fractional count
1
Fractional count
1
Scopus
citations

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