Re-print of "sub-eV ion deposition utilizing soft-landing ion mobility for controlled ion, ion cluster, and charged nanoparticle deposition"

Barbara L. Walton, William D. Hoffmann, Guido F. Verbeck

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Sub-eV ion deposition via soft-landing ion mobility has been utilized for a variety of applications. It has allowed for the deposition of a dielectric material onto graphene without introducing defects into the lattice structure. This deposition technique has also been used for surface enhanced Raman studies. Deposited silver has also been used as an alternative MALDI matrix for low mass compounds and shows promise for imaging applications.

Original languageEnglish (US)
Pages (from-to)214-221
Number of pages8
JournalInternational Journal of Mass Spectrometry
Volume377
Issue number1
DOIs
StatePublished - 2015
Externally publishedYes

Keywords

  • Ion mobility
  • MALDI
  • Preparative mass spectrometry
  • Soft-landing
  • Sub-eV deposition
  • Surface enhanced Raman

ASJC Scopus subject areas

  • Instrumentation
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

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